Dielectric characteristics of nanocrystailine Ag-Ba0.5Sr 0.5TiO3 composite thin films

Applied Physics Letters

Volumn 85, Issue 7, 2004, Pages 1211-1213

  Jayadevan, K P ^a   Liu, C Y ^a   Tseng, T Y ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAM EVAPORATION; FULL-WIDTH AT HALF MAXIMA (FWHM); GRAIN BOUNDARY DIFFUSION; METAL-DIELECTRIC COMPOSITES;

CHARGE CARRIERS; ELECTROMAGNETIC WAVE PROPAGATION; MICROSTRUCTURE; MIM DEVICES; NANOSTRUCTURED MATERIALS; PERMITTIVITY; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILVER COMPOUNDS; SOL-GELS; SPIN COATING; X RAY DIFFRACTION ANALYSIS;

THIN FILMS;

EID: 4444381356     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1780596     Document Type: Article

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