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Volumn 105, Issue 12, 2009, Pages

In situ formation of tin nanocrystals embedded in silicon nitride matrix

Author keywords

[No Author keywords available]

Indexed keywords

COSPUTTERING; IN-SITU FORMATIONS; LOW TEMPERATURES; MATRIX; SILICON NITRIDE MATRIX; SUBSTRATE HEATING; SUBSTRATE TEMPERATURE; SURFACE MOBILITY; TEM; TIN NANOCRYSTALS; X-RAY DIFFRACTION MEASUREMENTS;

EID: 67650227678     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3148262     Document Type: Conference Paper
Times cited : (9)

References (26)
  • 18
    • 67650215786 scopus 로고    scopus 로고
    • NIST x-ray photoelectron spectroscopy database.
    • NIST x-ray photoelectron spectroscopy database, http://srdata.nist.gov/ xps.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.