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Volumn 44, Issue 13, 2009, Pages 3556-3560

Thickness effects of Bi3.5Nd0.5Ti3O 12 buffer layers on structure and electrical properties of BiFeO 3 films

Author keywords

[No Author keywords available]

Indexed keywords

BFO FILMS; BUFFER LAYER THICKNESS; DOUBLE-LAYERED FILMS; ELECTRICAL PROPERTY; INDIUM TIN OXIDE; METAL ORGANIC DECOMPOSITION; P-E HYSTERESIS LOOPS; REMANENT POLARIZATION; SI SUBSTRATES; THICKNESS EFFECT;

EID: 67649958071     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-009-3479-7     Document Type: Article
Times cited : (3)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.