A new approach to estimate complex permittivity of dielectric materials at microwave frequencies using waveguide measurements

IEEE Transactions on Microwave Theory and Techniques

Volumn 45, Issue 3, 1997, Pages 359-366

  Deshpande, Manohar D ^a,b,c   Jagadeswara Reddy, C ^a   Tiemsin, Pacita I ^a   Cravey, Robin ^a  

^a VIGYAN INC   (United States)

^b HAMPTON UNIVERSITY   (United States)

^c NASA LANGLEY RESEARCH CENTER   (United States)

Author keywords

Dielectric constant; Finite element method

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC NETWORK ANALYZERS; ELECTROMAGNETIC WAVE REFLECTION; FINITE ELEMENT METHOD; PARAMETER ESTIMATION; RECTANGULAR WAVEGUIDES;

AIRGAPS; MICROWAVE FREQUENCIES; REFLECTION COEFFICIENT; WAVEGUIDE MEASUREMENTS; WAVEGUIDE MODAL THEORY;

PERMITTIVITY MEASUREMENT;

EID: 0031102728     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.563334     Document Type: Article

References (8)

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