High-resolution computed tomography with a compact soft x-ray microscope

Optics Express

Volumn 17, Issue 13, 2009, Pages 11057-11065

  Bertilson, Michael ^a   Hofsten, Olov Von ^a   Vogt, Ulrich ^a   Holmberg, Anders ^a   Hertz, Hans M ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERIZED TOMOGRAPHY; PLATES (STRUCTURAL COMPONENTS); TOMOGRAPHY;

BIOLOGICAL SPECIMENS; DIFFERENTIAL PHASE; EXTENDED DEPTH OF FOCUS; FILTERED BACK PROJECTION; HIGH-RESOLUTION COMPUTED TOMOGRAPHY; MICROSCOPIC RESOLUTION; SOFT X RAY TOMOGRAPHY; SOFT X-RAY MICROSCOPY;

X RAY MICROSCOPES;

SILICON DIOXIDE;

ALGORITHM; ARTICLE; CHEMISTRY; COMPUTER ASSISTED TOMOGRAPHY; CRYOELECTRON MICROSCOPY; DIATOM; EQUIPMENT DESIGN; IMAGE PROCESSING; METHODOLOGY; MICROSCOPY; OPTICAL INSTRUMENTATION; OPTICS; PHOTON; SYNCHROTRON; X RAY;

ALGORITHMS; CRYOELECTRON MICROSCOPY; DIATOMS; EQUIPMENT DESIGN; IMAGE PROCESSING, COMPUTER-ASSISTED; MICROSCOPY; OPTICAL DEVICES; OPTICS AND PHOTONICS; PHOTONS; SILICON DIOXIDE; SYNCHROTRONS; TOMOGRAPHY, X-RAY COMPUTED; X-RAYS;

EID: 67649271251     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.011057     Document Type: Article

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