High-resolution x-ray tomography using laboratory sources

Progress in Biomedical Optics and Imaging - Proceedings of SPIE

Volumn 6318, Issue , 2006, Pages

  Tkachuk, Andrei ^a   Feser, Michael ^a   Cui, Hongtao ^a   Duewer, Fred ^a   Chang, Hauyee ^a   Yun, Wenbing ^a  

^a XRADIA INC   (United States)

Author keywords

Computed tomography; Fresnel zone plate; X ray microscopy

Indexed keywords

ELECTRON ENERGY LEVELS; IMAGING SYSTEMS; NONDESTRUCTIVE EXAMINATION; OPTICAL RESOLVING POWER; X RAY MICROSCOPES; X RAYS;

FRESNEL ZONE PLATES; X-RAY COMPUTED TOMOGRAPHY (XCT); X-RAY MICROSCOPY; X-RAY SOURCES;

COMPUTERIZED TOMOGRAPHY;

EID: 33750700479     PISSN: 16057422     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.682383     Document Type: Conference Paper

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