Low-Temperature Growth of Nanocrystalline Mn-Doped ZnS Thin Films Prepared by Chemical Bath Deposition and Optical Properties

Chemistry of Materials

Volumn 21, Issue 12, 2009, Pages 2375-2385

  Goudarzi, Alireza ^a   Aval, Ghaffar Motedayen ^a   Park, Sung Soo ^b   Choi, Myeon Cheon ^b   Sahraei, Reza ^c   Ullah, M Habib ^b   Avane, Armen ^d   Ha, Chang Sik ^b  

^a KHARAZMI UNIVERSITY   (Iran)

^b Pusan National University   (South Korea)

^c ILAM UNIVERSITY   (Iran)

^d UNIVERSITY OF MARAGHEH   (Iran)

Author keywords

[No Author keywords available]

Indexed keywords

AQUEOUS SOLUTIONS; ATR FTIR; ATTENUATED TOTAL REFLECTIONS; CHEMICAL-BATH DEPOSITION; COMPLEXING AGENTS; CRYSTALLINITY; DEPOSITION TIME; DISODIUM SALT; ENERGY DISPERSIVE X-RAY; ETHYLENE DIAMINE TETRA-ACETIC ACID; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; FOURIER TRANSFORM INFRARED; GLASS SUBSTRATES; GRAIN SIZE; GRAIN SIZE DISTRIBUTION; HOMOGENEOUS MORPHOLOGY; INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION SPECTROSCOPY; LOW TEMPERATURE GROWTH; MN-DOPED; MN-DOPING; MOLAR RATIO; NANOCRYSTALLINE; POLYCRYSTALLINE; PROCESS PARAMETERS; QUANTUM SIZE EFFECTS; RUTHERFORD BACK-SCATTERING; SEM; THIOACETAMIDE; TRANSMISSION SPECTROSCOPY; TRANSMISSION SPECTRUMS; VISIBLE LIGHT; VISIBLE REGION; X RAY DIFFRACTOMETERS; ZINC IONS;

AMINES; ATOMIC SPECTROSCOPY; AUGER ELECTRON SPECTROSCOPY; CHEMICAL VAPOR DEPOSITION; DIFFRACTION; DOPING (ADDITIVES); EMISSION SPECTROSCOPY; ETHYLENE; FIELD EMISSION; FIELD EMISSION MICROSCOPES; FILM PREPARATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GRAIN SIZE AND SHAPE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INDUCTIVELY COUPLED PLASMA; LIGHT; LIGHT REFLECTION; MANGANESE; MANGANESE COMPOUNDS; MOLECULAR SPECTROSCOPY; MORPHOLOGY; OPTICAL EMISSION SPECTROSCOPY; OPTICAL PROPERTIES; OXIDE MINERALS; QUARTZ; RANGE FINDING; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING SILICON COMPOUNDS; SPECTROMETERS; SPECTROMETRY; SPECTRUM ANALYSIS; THIN FILMS; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY; X RAY DIFFRACTION; ZINC; ZINC SULFIDE;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 67649258956     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm803329w     Document Type: Article

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