Extended X-ray absorption fine structure studies of zinc hydroxo-sulphide thin films chemically deposited from aqueous solution

Thin Solid Films

Volumn 288, Issue 1-2, 1996, Pages 21-28

  Mokili, B ^a   Charreire, Y ^a   Cortes, R ^b   Lincot, D ^a  

^a CNRS   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

Deposition process; Fourier transform infrared spectroscopy (FTIR); Structural properties; Sulphides; X Ray absorption

Indexed keywords

ADDITIVES; AMINES; AMMONIA; COMPOSITION EFFECTS; COMPUTER SIMULATION; DEPOSITION; FILM PREPARATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; SEMICONDUCTING ZINC COMPOUNDS; SOLUTIONS; THIN FILMS; ZINC SULFIDE;

CHEMICAL BATH DEPOSITION (CBD); EXTENDED X RAY ABSORPTION FINE STRUCTURE (EXAFS); SULFUR PRECURSORS; THIOUREA; ZINC HYDROXOSULFIDE THIN FILMS;

SEMICONDUCTING FILMS;

EID: 0030290607     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(96)08805-0     Document Type: Article

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