Structure evolution in chemical vapor-deposited ZnS films

Journal of Physical Chemistry B

Volumn 107, Issue 22, 2003, Pages 5208-5211

  Lee, Everett Y M ^a   Tran, Nguyen H ^a   Russell, Jennifer J ^a   Lamb, Robert N ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELECTRON DIFFRACTION; SILICON WAFERS; STRUCTURE (COMPOSITION); TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; ZINC SULFIDE;

CRYSTALLOGRAPHIC DEFECTS;

THIN FILMS;

EID: 0037834419     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp027366d     Document Type: Article

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