Scanning probe charge reading of ferroelectric domains

Applied Physics Letters

Volumn 94, Issue 6, 2009, Pages

  Kim, Byong M ^a   Adams, Donald E ^a   Tran, Quan ^b   Ma, Qing ^b   Rao, Valluri ^b  

^a Nanochip Inc   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FERROELECTRICITY; MODULATION; PIEZOELECTRICITY; POLARIZATION; PROBES; SIGNAL PROCESSING; SIGNAL TO NOISE RATIO;

ALTERNATING POLARIZATIONS; CONTACT FORCES; DATA RATES; DETECTION TECHNIQUES; FERROELECTRIC DOMAINS; PIEZO-ELECTRIC EFFECTS; PROBE TIPS; SCANNING PROBES; SCANNING SPEED; SIGNAL FREQUENCIES; SIGNAL-TO-NOISE RATIOS;

SCANNING;

EID: 60349100069     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3081020     Document Type: Article

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