Contact-resonance atomic force microscopy for nanoscale elastic property measurements: Spectroscopy and imaging

Ultramicroscopy

Volumn 109, Issue 8, 2009, Pages 929-936

  Stan, G ^a   Krylyuk, S ^a   Davydov, A V ^a   Vaudin, M D ^a   Bendersky, L A ^a   Cook, R F ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Contact resonance atomic force microscopy; Nanoscale elastic property measurements

Indexed keywords

ACCURACY AND PRECISION; AFM; AFM IMAGING; CONTACT-RESONANCE ATOMIC FORCE MICROSCOPY; CORE SHELL STRUCTURE; ELASTIC MODULUS MEASUREMENTS; ELASTIC PROPERTIES; INDENTATION MODULUS; MICROMETER-SCALE; NANO SCALE; NANO-SIZE; NANOSCALE ELASTIC PROPERTY MEASUREMENTS; OUT-OF-PLANE; OUTER LAYER; QUANTITATIVE ESTIMATION; QUANTITATIVE MEASUREMENT; SIZE-DEPENDENCE; STIFFENING EFFECT; TELLURIUM NANOWIRES;

ATOMIC FORCE MICROSCOPY; ATOMIC SPECTROSCOPY; ATOMS; CRYSTALLOGRAPHY; ELASTICITY; ELECTRIC WIRE; NANOSTRUCTURED MATERIALS; NANOWIRES; RESONANCE; TELLURIUM; TELLURIUM COMPOUNDS;

ELASTIC MODULI;

NANOWIRE; TELLURIUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; CRYSTALLOGRAPHY; IMAGING; MEASUREMENT; NANOANALYSIS; QUANTITATIVE ANALYSIS; SPECTROSCOPY; STRUCTURE ANALYSIS; YOUNG MODULUS;

EID: 67449149692     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2009.03.025     Document Type: Article

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