Surface effects on the elastic modulus of Te nanowires

Applied Physics Letters

Volumn 92, Issue 24, 2008, Pages

  Stan, G ^a   Krylyuk, S ^a   Davydov, A V ^a   Vaudin, M ^a   Bendersky, L A ^a   Cook, R F ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTATIONAL GEOMETRY; ELECTRIC WIRE; ERROR ANALYSIS; IMAGING TECHNIQUES; INTERFACES (MATERIALS); MICROSCOPIC EXAMINATION; NANOSTRUCTURES; NANOWIRES; SCANNING PROBE MICROSCOPY; SURFACES; TELLURIUM COMPOUNDS;

(1 1 0) SURFACE; AMERICAN INSTITUTE OF PHYSICS (AIP); ATOMIC FORCE (AF); BULK PROPERTIES; DECREASING DIAMETER; ELASTIC INDENTATION; ELASTIC PROPERTIES; MODEL BASED (OPC); SIZE DEPENDENCE; SURFACE EFFECTS; WIRE DIAMETERS;

SURFACE PROPERTIES;

EID: 45749155213     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2945285     Document Type: Article

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