Measurement of the decay lengths of the near-field signal in tapping mode

Current Applied Physics

Volumn 9, Issue 6, 2009, Pages 1227-1231

  Barchiesi, D ^a   Grosges, T ^a  

^a UNIVERSITÉ DE TECHNOLOGIE DE TROYES   (France)

Author keywords

Image forming and processing; Image reconstruction; Near field scanning optical microscopy; Tomography

Indexed keywords

APPROACH CURVE; DECAY LENGTH; IMAGE FORMING AND PROCESSING; LOCK-IN; LOCK-IN AMPLIFIER; NEAR FIELD OPTICS; NEAR-FIELD; OPTICAL SIGNALS; SIMPLEX METHODS; TAPPING MODES; VERTICAL VARIATION; VERTICAL VIBRATIONS;

FEEDBACK; IMAGE RECONSTRUCTION; OPTICAL DATA STORAGE; OPTICAL INSTRUMENTS; OPTICAL SIGNAL PROCESSING; RESTORATION; SCANNING; TOMOGRAPHY;

NEAR FIELD SCANNING OPTICAL MICROSCOPY;

EID: 67349284649     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2009.01.021     Document Type: Article

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