Bow-tie optical antenna probes for single-emitter scanning near-field optical microscopy

Nanotechnology

Volumn 18, Issue 12, 2007, Pages

  Farahani, Javad N ^a,d   Eisler, Hans Jürgen ^a,e   Pohl, Dieter W ^a   Pavius, Michaël ^b   Flückiger, Philippe ^b   Gasser, Philippe ^c,d   Hecht, Bert ^a,f  

^a UNIVERSITY OF BASEL   (Switzerland)

^b EPFL   (Switzerland)

^c SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^d ETH ZURICH   (Switzerland)

^e UNIVERSITY OF KARLSRUHE   (Germany)

^f UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGE ANALYSIS; NEAR FIELD SCANNING OPTICAL MICROSCOPY; PHOTOLUMINESCENCE; PROBES; SEMICONDUCTOR QUANTUM DOTS; WAVELENGTH;

OPTICAL ANTENNAS; OPTICAL PROBES; SINGLE QUANTUM DOTS; SPATIAL RESOLUTION;

OPTICAL DEVICES;

QUANTUM DOT;

ANTENNA; ARTICLE; MECHANICAL PROBE; OPTICS; PHOTOLUMINESCENCE; PRIORITY JOURNAL; ROOM TEMPERATURE; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SPECTROSCOPY;

EID: 33947538563     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/12/125506     Document Type: Article

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