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Volumn 8, Issue , 2006, Pages
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Measurement of decay lengths of evanescent waves: The lock-in nonlinear filtering
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
DATA ACQUISITION;
OPTICAL MICROSCOPY;
SIGNAL DETECTION;
VIBRATION CONTROL;
DECAY LENGTHS;
EVANESCENT WAVES;
SCANNING NEAR-FIELD OPTICAL MICROSCOPY;
ELASTIC WAVES;
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EID: 33750583403
PISSN: 13672630
EISSN: 13672630
Source Type: Journal
DOI: 10.1088/1367-2630/8/11/263 Document Type: Review |
Times cited : (6)
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References (21)
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