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Volumn 385, Issue 4, 2009, Pages 624-629

Measurement of the unstained biological sample by a novel scanning electron generation X-ray microscope based on SEM

Author keywords

Biological sample; Indirect secondary electron contrast; Monte Carlo simulation; Scanning electron microscopy; Silicon nitride film; Titanium coating; X ray microscopy

Indexed keywords

SILICON NITRIDE; TITANIUM;

EID: 67349193233     PISSN: 0006291X     EISSN: 10902104     Source Type: Journal    
DOI: 10.1016/j.bbrc.2009.05.107     Document Type: Article
Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.