Analyzing indirect secondary electron contrast of unstained bacteriophage T4 based on SEM images and Monte Carlo simulations

Biochemical and Biophysical Research Communications

Volumn 380, Issue 2, 2009, Pages 254-259

  Ogura, Toshihiko ^a,b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Bacteriophage T4; Indirect secondary electron contrast; Monte Carlo simulation; Scanning electron microscopy; Secondary electron; Thin carbon film; Virus

Indexed keywords

CARBON;

ARTICLE; BACTERIOPHAGE T4; CONTRAST; ELECTRIC POTENTIAL; ELECTRON BEAM; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; FILM; IMAGE ANALYSIS; INDIRECT SECONDARY ELECTRON CONTRAST; INTERMETHOD COMPARISON; IRRADIATION; MOLECULAR MECHANICS; MONTE CARLO METHOD; NONHUMAN; OPTICAL RESOLUTION; PRIORITY JOURNAL; STRUCTURE ANALYSIS;

BACTERIOPHAGE T4; ELECTRONS; MICROSCOPY, ELECTRON, SCANNING; MONTE CARLO METHOD;

EID: 60349108168     PISSN: 0006291X     EISSN: 10902104     Source Type: Journal    
DOI: 10.1016/j.bbrc.2009.01.046     Document Type: Article

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