Degradation of high power LEDs at dynamic working conditions

Solid-State Electronics

Volumn 53, Issue 6, 2009, Pages 567-570

  Yang, Lianqiao ^a   Hu, Jianzheng ^b   Shin, Moo Whan ^a  

^a Myong Ji University   (South Korea)

^b Rainbow Optoelectronics Material Shanghai Co Ltd   (China)

Author keywords

Arrhenius effective temperature (AET); Dynamic working condition; Light emitting diode (LED); Theoretical degradation model

Indexed keywords

EID: 67349166098     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2009.03.014     Document Type: Letter

References (15)

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