Thermal investigation of high power optical devices by transient testing

IEEE Transactions on Components and Packaging Technologies

Volumn 28, Issue 1, 2005, Pages 45-50

  Farkas, Gábor ^a,b   van Voorst Vader, Quint ^c   Poppe, András ^a,b   Bognár, György ^b  

^a MicReD Ltd   (Hungary)

^b BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

^c Lumileds Lighting BV   (Netherlands)

Author keywords

Light emitting diodes (LEDs); Opto electronic devices; Thermal measurement

Indexed keywords

HEAT RESISTANCE; LIGHT EMITTING DIODES; MATHEMATICAL MODELS; OPTICAL VARIABLES MEASUREMENT; THERMAL VARIABLES MEASUREMENT; THERMODYNAMICS;

HIGH POWER OPTICAL DEVICES; TRANSIENT TESTING;

OPTOELECTRONIC DEVICES;

EID: 15744383645     PISSN: 15213331     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAPT.2004.843197     Document Type: Article

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