Electrical contact reliability in a magnetic MEMS switch

Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts

Volumn , Issue , 2008, Pages 145-150

  Vincent, M ^a   Chiesi, L ^a   Fourrier, J C ^a   Garnier, A ^a   Grappe, B ^a   Lapiere, C ^a   Coutier, C ^a   Samperio, A ^a   Paineau, S ^a   Houze F ^b   Noel S ^b  

^a SCHNEIDER ELECTRIC   (France)

^b UNIV PARIS SUD   (France)

Author keywords

MEMS microswitch, Reliability, Electrical contact

Indexed keywords

ELECTRIC SWITCHES; RELIABILITY;

CONTACT DEGRADATION; ELECTRICAL CONTACTS; MAGNETIC MEMS; MEMS TECHNOLOGY; MICROSWITCHES; OHMIC SWITCH; SCHNEIDER ELECTRICS; SWITCHING TESTS;

ELECTRIC CONTACTS;

EID: 67249102322     PISSN: 03614395     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HOLM.2008.ECP.36     Document Type: Conference Paper

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