The phonon contribution to high-resolution electron microscope images

Ultramicroscopy

Volumn 96, Issue 3-4, 2003, Pages 361-365

  Boothroyd, C B ^a   Yeadon, M ^a  

^a INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

Author keywords

Convergent beam electron diffraction; Diffuse scattering; Energy filtering; Lattice images; Phonon scattering; Quantitative HREM

Indexed keywords

AMORPHOUS SILICON; ELECTROMAGNETIC WAVE SCATTERING; ELECTRON MICROSCOPY; OPTICAL RESOLVING POWER; PHONONS;

DIFFUSE SCATTERING; PHONON SCATTERING;

IMAGING TECHNIQUES;

SILICON DIOXIDE;

ATOMIC PARTICLE; CONFERENCE PAPER; DIFFRACTION; DIFFUSION COEFFICIENT; ELECTRON MICROSCOPE; PHONON; RADIATION SCATTERING;

EID: 0037488175     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00101-3     Document Type: Conference Paper

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