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Volumn 252, Issue 11, 2006, Pages 3984-3988
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Quantitative measurement of image intensity in transmission electron microscope images
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Author keywords
Energy filtered images; High resolution transmission electron microscopy; Lattice images; Stobbs factor
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Indexed keywords
COMPUTER SIMULATION;
DIFFRACTION;
ELECTRON BEAMS;
SEMICONDUCTING GALLIUM ARSENIDE;
TRANSMISSION ELECTRON MICROSCOPY;
ENERGY-FILTERED IMAGES;
HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
LATTICE IMAGES;
STOBBS FACTORS;
IMAGE ANALYSIS;
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EID: 33645217302
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/j.apsusc.2005.09.031 Document Type: Conference Paper |
Times cited : (4)
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References (19)
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