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Review of Scientific Instruments

Volumn 80, Issue 5, 2009, Pages

Quantitative displacement measurement of a nanotube cantilever with nanometer accuracy using epifluorescence microscopy

(3) Park, Hyojun a Kwon, Soongeun a Kim, Soohyun a

a Korea Advanced Institute of Science and Technology (KAIST) (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DISPLACEMENT MEASUREMENTS; ELECTROSTATIC ACTUATION; EPIFLUORESCENCE MICROSCOPE; EPIFLUORESCENCE MICROSCOPY; ETCHED TUNGSTEN TIP; FLUORESCENCE INTENSITIES; FLUORESCENT DYES; FLUORESCENT PARTICLE; FORCE TRANSDUCERS; GAUSSIAN; LEAST SQUARES METHODS; LIQUID ENVIRONMENT; PICO-NEWTON FORCE; POSITIONAL ACCURACY;

ATOMIC FORCE MICROSCOPY; ELECTROSTATIC ACTUATORS; FLUORESCENCE; MULTIWALLED CARBON NANOTUBES (MWCN); NANOCANTILEVERS; TUNGSTEN;

CARBON NANOTUBES;

FLUORESCENT DYE; NANOTUBE;

ARTICLE; CHEMISTRY; FLUORESCENCE MICROSCOPY; INSTRUMENTATION; METHODOLOGY; STATIC ELECTRICITY;

FLUORESCENT DYES; MICROSCOPY, FLUORESCENCE; NANOTUBES; STATIC ELECTRICITY;

EID: 66549112176 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3139004 Document Type: Article

Times cited : (3)

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