Determination of the bending modulus of an individual multiwall carbon nanotube using an electric harmonic detection of resonance technique

Nano Letters

Volumn 5, Issue 12, 2005, Pages 2389-2393

  Ciocan, R ^a   Gaillard, J ^a   Skove, M J ^a   Rao, A M ^a  

^a CLEMSON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIVING BOARD RESONANCE; ELECTRIC HARMONIC DETECTION; MULTIWALL CARBON NANOTUBES (MWNT);

CARBON; ELECTROSTATICS; OSCILLATIONS; RESONANCE;

NANOTUBES;

CARBON NANOTUBE;

ALGORITHM; ARTICLE; CHEMISTRY; ELASTICITY; ELECTRICITY; ELECTROCHEMISTRY; MATERIALS TESTING; MECHANICAL STRESS; METHODOLOGY; NANOTECHNOLOGY; OSCILLOMETRY; STIMULATION; VIBRATION;

ALGORITHMS; ELASTICITY; ELECTROCHEMISTRY; ELECTROSTATICS; MATERIALS TESTING; NANOTECHNOLOGY; NANOTUBES, CARBON; OSCILLOMETRY; PHYSICAL STIMULATION; STRESS, MECHANICAL; VIBRATION;

EID: 30644480186     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0514644     Document Type: Article

References (17)

1. Treacy, M. M. J.; Ebbesen, T. W.; Gibson, J. M. Nature 1996, 381, 678.
2. Wong, E. W.; Sheehan, P. E.; Lieber, C. M. Science 1997, 277, 1971.
3. Yu, M.; Lourie, O.; Dyer, M. J.; Moloni, K.; Kelly, T. F.; Ruoff, R. S. Science 2000, 287, 637.
4. Lourie, O.; Wagner, H. D. J. Mater. Res. 1998, 13, 2418.
5. Poncharal, P.; Wang, Z. L.; Ugarte, D.; de Heer, W. A. Science 1999, 283, 1513.
6. Yu, M.; Wagner, G. J.; Ruoff, R. S.; Dyer, M. J. Phys. Rev. B 2002, 66, 073406.
7. Purcell, S. T.; Vincent, P.; Journet, C.; Vu Thien Binh Phys. Rev. Lett. 2002, 89, 276103.
8. Yum, K.; Wang, Z.; Suryavanshi, A. P.; Yu, M. J. Appl. Phys. 2004, 96, 3933.
9. Gaillard, J.; Skove, M. J.; Rao, A. M. Proc. Mater. Res. Soc. Meeting, Boston, MA, 2004.
10. Gao, R.; Pan, Z.; Wang, Z. L. Appl. Phys. Lett. 2001, 78, 757.
11. Main, I. G. Vibration and Waves in Physics; Cambridge University Press: Cambridge, U.K., 1993; p 59.
12. Gaillard, J.; Skove, M. J.; Rao, A. M. Appl. Phys. Lett. 2005, 86, 233109.
13. Sarid, D. Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces; Oxford University Press: New York, 1991; p 142.
14. Wang, Z. L.; Poncharal, P.; de Heer, W. A. Pure Appl. Chem. 2000, 72, 209.
15. Qian, D.; Wagner, G. J.; Liu, W. K.; Yu, M.; Ruoff, R. S. Appl. Mech. Rev. 2002, 55, 495.
16. Lu, Q.; Keskar, G.; Ciocan, R.; Larcom, L. L.; Rao, A. M. NT05: Sixth International Conference on the Science and Application of Nanotubes; Gothenburg, Sweden, 2005; p 426.
17. Sazonova, V.; Yaishm, Y.; Ustünel, H.; Roundy, D.; Arias, T.; McEuen, P. Nature 2004, 431, 284.