Subresolution axial distance measurements in far-field fluorescence microscopy with precision of 1 nanometer

Review of Scientific Instruments

Volumn 71, Issue 7, 2000, Pages 2742-2745

  Schmidt, Michael ^a   Nagorni, Matthias ^a   Hell, Stefan W ^a  

^a MAX PLANCK INSTITUTE FOR BIOPHYSICAL CHEMISTRY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000586767     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150685     Document Type: Article

References (12)

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