Profilometry without phase unwrapping using multi-frequency and four-step phase-shift sinusoidal fringe projection

Optics Express

Volumn 17, Issue 10, 2009, Pages 7818-7830

  Kim, Eun Hee ^a   Hahn, Joonku ^a   Kim, Hwi ^a   Lee, Byoungho ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

PROFILOMETRY;

ABSOLUTE COORDINATE; CONTINUOUS OBJECTS; DEPTH EXTRACTION; DEPTH INFORMATION; DISCONTINUOUS OBJECTS; FRINGE PROJECTION; GEOMETRIC ANALYSIS; THREEDIMENSIONAL (3-D);

PHASE SHIFT;

EID: 66449102102     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.007818     Document Type: Article

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