Moiré profilometry using liquid crystals for projection and demodulation

Optics Express

Volumn 16, Issue 1, 2008, Pages 179-193

  Buytaert, Jan A N ^a   Dirckx, Joris J J ^a  

^a UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

GEOMETRY; GRID COMPUTING; LIGHT MODULATORS; PROFILOMETRY; THIN FILM TRANSISTORS; TOPOGRAPHY;

HEIGHT RESOLUTION; OPTICAL DEMODULATION;

LIQUID CRYSTALS;

ARTICLE; CHEMISTRY; COMPUTER AIDED DESIGN; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; ILLUMINATION; INSTRUMENTATION; LIQUID CRYSTAL; METHODOLOGY; REFRACTOMETRY; SIGNAL PROCESSING; SURFACE PROPERTY; THREE DIMENSIONAL IMAGING;

COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGING, THREE-DIMENSIONAL; LIGHTING; LIQUID CRYSTALS; REFRACTOMETRY; SIGNAL PROCESSING, COMPUTER-ASSISTED; SURFACE PROPERTIES;

EID: 38049125099     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.000179     Document Type: Article

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