Calibration-based two-frequency projected fringe profilometry: A robust, accurate, and single-shot measurement for objects with large depth discontinuities

Optics Express

Volumn 14, Issue 20, 2006, Pages 9178-9187

  Su, Wei Hung ^a   Liu, Hongyu ^b  

^a NATIONAL SUN YAT SEN UNIVERSITY   (Taiwan)

^b The Center for Nanotechnology Education and Utilization   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; DATA ACQUISITION; NATURAL FREQUENCIES;

PHASE UNWRAPPING; SHAPE MEASUREMENTS;

PROFILOMETRY;

EID: 33749411074     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.14.009178     Document Type: Article

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