Two-frequency grating used in phase-measuring profilometry

Applied Optics

Volumn 36, Issue 1, 1997, Pages 277-280

  Li, Jie Lin ^a   Su, Hong Jun ^a   Su, Xian Yu ^a  

^a SICHUAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000961368     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.000277     Document Type: Article

References (14)

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