Imaging a coupled quantum dot-quantum point contact system

Journal of Applied Physics

Volumn 102, Issue 8, 2007, Pages

  Gildemeister, A E ^a   Ihn, T ^a   Schleser, R ^a   Ensslin, K ^a   Driscoll, D C ^b   Gossard, A C ^b  

^a ETH ZURICH   (Switzerland)

^b University of California at Santa Barbara   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE DENSITY; CHARGE TRAPPING; ELECTRIC CONDUCTANCE; ELECTRIC POTENTIAL; IMAGING TECHNIQUES;

LOW TEMPERATURE SCANNING; QUANTUM POINT CONTACT SYSTEMS; SCANNED GATES; SHARP METALLIC TIPS;

SEMICONDUCTOR QUANTUM DOTS;

EID: 35648944226     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2787163     Document Type: Article

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