Assessing non-normally distributed processes by interval estimation of the incapability indexcpp

Quality and Reliability Engineering International

Volumn 25, Issue 4, 2009, Pages 427-437

  Ke, J C ^a   Chu, Y K ^a   Chung, Y T ^b   Lin, P C ^b  

^a NATIONAL TAICHUNG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL CHIN YI UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

Bayesian bootstrap; Bootstrap pivotal; Bootstrap resampling; Coverage percentage; Process capability index; Relative coverage; Upper confidence bound

Indexed keywords

BAYESIAN BOOTSTRAP; BOOTSTRAP PIVOTAL; BOOTSTRAP RESAMPLING; COVERAGE PERCENTAGE; PROCESS CAPABILITY INDEX; RELATIVE COVERAGE; UPPER CONFIDENCE BOUND;

BAYESIAN NETWORKS; ESTIMATION; PROCESS CONTROL; PROCESS ENGINEERING;

NORMAL DISTRIBUTION;

EID: 66149130577     PISSN: 07488017     EISSN: 10991638     Source Type: Journal    
DOI: 10.1002/qre.979     Document Type: Article

References (27)

1. Kotz S, Johnson NL. Process capability indices-A review, 1992-2000 (with Discussion). Journal of Quality Technology 2002; 34:2-19.
2. Spring F, Leung B, Cheng S, Yeung A. A bibliography of process capability papers. Quality and Reliability Engineering International 2003; 19:445-460.
3. Lin PC, Pearn WL. Testing process capability for one-sided specification limit with application to the voltage level translator. Microelectronics Reliability 2002; 42:1975-1983.
4. Pearn WL, Lin PC. Computer program for calculating the p-value in testing process capability index Cpmk. Quality and Reliability Engineering International 2002; 18:333-342.
5. Chen KS, Pearn WL, Lin PC. Capability measures for processes with multiple characteristics. Quality and Reliability Engineering International 2003; 19:101-110.
6. V̈annman K, Hubele NF. Distributional properties of estimated capability indices based on subsamples. Quality and Reliability Engineering International 2003; 19:111-128.
7. Wu CW, Pearn WL. Capability testing based on Cpm with multiple samples. Quality and Reliability Engineering International 2005; 21:29-42.
8. Lin GH, Pearn WL, Yang YS. A Bayesian approach to obtain a lower bound for the Cpm capability index. Quality and Reliability Engineering International 2005; 21:655-668.
9. Pearn WL, Lin PC, Chang YC, Wu CW. Quality yield measure for processes with asymmetric tolerances. IIE Transactions 2006; 38:619-633.
10. Mathew T, Sebastian G, Kurian KM. Generalized confidence intervals for process capability indices. Quality and Reliability Engineering International 2007; 23:471-481.
11. V̈annman K, Kulahci M. A model-free approach to eliminate autocorrelation when testing for process capability.Quality and Reliability Engineering International 2008; 24:213-228.
12. Kane VE. Process capability indices. Journal of Quality Technology 1986; 18:41-52.
13. Chan LK, Cheng SW, Spiring FA. A new measure of process capability: Cpm. Journal of Quality Technology 1988; 20:162-175.
14. Boyles RA. The Taguchi capability index. Journal of Quality Technology 1991; 23:17-26.
15. Greenwich M, Jahr-Schaffrath BL. A process incapability index. International Journal of Quality and Reliability Management 1995; 12:58-71.
16. Lin PC, Pearn WL. Assessing process performance based on the incapability index Cpp. International Journal of Industrial Engineering 2005; 12:143-156.
17. Roussas GG. A Course in Mathematical Statistics (2nd edn). Academic Press: New York, 1997.
18. Hogg RV, Craig AT. Introduction to Mathematical Statistics (5th edn). Pearson Prentice Hall: Upper Saddle River, 1995.
19. Efron B. Bootstrap methods: Another look at the jackknife. Annals of Statistics 1979; 7:1-26.
20. Efron B. The jackknife, the bootstrap, and other resampling plans. SIAM Monograph 1982; 38.
21. Rubin RG. The Bayesian bootstrap. Annals of Statistics 1981; 9:130-134.
22. Miller DB. The jackknife-A review. Biometrika 1974; 61:1-15.
23. Wasserman L. All of Statistics: A Concise Course in Statistical Inference. Springer Science, Business Media, Inc., 2004.
24. Pearn WL, Wu CW, Wang KH. Capability measure for asymmetric tolerance non-normal processes applied to speaker driver manufacturing. International Journal of Advanced Manufacturing Technology 2004; 25:506-515.
25. pk index for asymmetric tolerances: Implications and inference. Metrika 2004; 60:119-136.
26. Juran Institute. The tools of quality, part IV: Histograms. Quality Progress 1990; 9:75-78.
27. Chou YM, Polansky AM, Mason RL. Transforming non-normal data to normality in statistical process control. Journal of Quality Technology 1998; 30:133-141.