Quality yield measure for processes with asymmetric tolerances

IIE Transactions (Institute of Industrial Engineers)

Volumn 38, Issue 8, 2006, Pages 619-633

  Pearn, W L ^a   Lin, P C ^b   Chang, Y C ^c   Wu, Chien Wei ^d  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL CHIN YI UNIVERSITY OF TECHNOLOGY   (Taiwan)

^c CHING YUN UNIVERSITY   (Taiwan)

^d FENG CHIA UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

FITS AND TOLERANCES; PERFORMANCE; QUALITY CONTROL; SPECIFICATIONS;

ASYMMETRIC TOLERANCES; PROCESS CAPABILITY INDICES; QUALITY YIELD INDEX;

STATISTICAL PROCESS CONTROL;

EID: 33744740304     PISSN: 0740817X     EISSN: 15458830     Source Type: Journal    
DOI: 10.1080/07408170600692150     Document Type: Article

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