Capability measures for processes with multiple characteristics

Quality and Reliability Engineering International

Volumn 19, Issue 2, 2003, Pages 101-110

  Chen, K S ^a   Pearn, W L ^b   Lin, P C ^c  

^a NATIONAL CHIN YI UNIVERSITY OF TECHNOLOGY   (Taiwan)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^c NONE

Author keywords

Capability zone; MCPCA chart; Multiple characteristics; Process capability index; Process yield index

Indexed keywords

FUNCTIONS; NUMERICAL ANALYSIS; QUALITY ASSURANCE; SPECIFICATIONS;

PROCESS PERFORMANCE;

PROCESS ENGINEERING;

EID: 0037357929     PISSN: 07488017     EISSN: None     Source Type: Journal    
DOI: 10.1002/qre.513     Document Type: Article

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