Focused ion beam as tool for atomic force microscope (AFM) probes sculpturing

Journal of Physics: Conference Series

Volumn 126, Issue , 2008, Pages

  Menozzi, C ^a   Calabri, L ^a   Facci, P ^a   Pingue, P ^b   Dinelli, F ^c   Baschieri, P ^c  

^a CNR Consiglio Nazionale delle Ricerche   (Italy)

^b INFM   (Italy)

^c CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 65649117752     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/126/1/012070     Document Type: Article

References (13)

1. Alessandrini A and Facci P 2005 Meas. Sci. Technol. 16 R65
2. Martin Y, Abraham D W and Wickramasinghe H K 1988 Appl. Phys. Lett. 52 1103
3. Ma Y R, Yu C, Yao Y D, Liu Y and Lee S F 2001 Phys. Rev. B 64 195324
4. Gazzadi G, Angeli E, Facci P and Frabboni S 2006 Appl. Phys. Lett. 89 173112
5. Matsui S, Kaito T, Fujita J, Komuro M, Kanda K and Haruyama Y 2000 J. Vac. Sci. Technol. B 18 3181
6. Pingue P, Piazza V, Baschieri P, Ascoli C, Menozzi C, Alessandrini A and Facci P 2006 Appl. Phys. Lett. 88 043510
7. Kageshima M, Ogiso H, Nakano S, Lantz M A and Tokumoto H 1999 Jpn J. Appl. Phys. 38 3958
8. Folks L, Best M E, Rice P, Terris B D, Weller D and Chapman J N 2000 Appl. Phys. Lett. 76 909
9. Bhushan B, Koinkar V N 1994 Appl. Phys. Lett. 64 1653-1655
10. Calabri L, Pugno N, Rota A, Marchetto D and Valeri S 2007 J. Phys.: Condens. Matter in press
11. Guo L, Krauss P R and Chou S Y 1997 Appl. Phys. Lett. 71 1881-1883
12. Talla J, Gordon M, Berton K, Charley A L and Peyrade D 2006 Microelectron. Eng. 83 851-854
13. Pugno N M 2007 Acta Mater. 55 1947-1953