Modeling the optical properties of tin oxide thin films

Thin Solid Films

Volumn 517, Issue 17, 2009, Pages 5146-5150

  Goldsmith, S ^a   Cetinorgu E ^b   Boxman, R L ^a  

^a TEL AVIV UNIVERSITY   (Israel)

^b ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

Modeling; Optical properties; Thin films; Tin oxide

Indexed keywords

COVALENT SOLIDS; DIELECTRIC FUNCTIONS; EFFECTIVE-MEDIUM THEORIES; FILM COMPOSITION; INTERBAND ABSORPTION; MODELING; MODELING APPROACH; OPTICAL AND ELECTRICAL PROPERTIES; OPTICAL CHARACTERISTICS; OPTICAL DATA; SEMIEMPIRICAL MODELS; STRUCTURAL CHARACTERISTICS; TIN OXIDE THIN FILM; VISIBLE RANGE;

ELECTRIC PROPERTIES; LIGHT REFRACTION; OPTICAL CORRELATION; ORGANIC POLYMERS; OXIDE FILMS; REFRACTIVE INDEX; REFRACTOMETERS; THIN FILMS; TIN;

OPTICAL FILMS;

EID: 65649115085     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2009.03.019     Document Type: Article

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