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Volumn 20, Issue 18, 2009, Pages
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A novel method for fabricating sub-16 nm footprint T-gate nanoimprint molds
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Author keywords
[No Author keywords available]
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Indexed keywords
HIGH-SPEED TRANSISTORS;
NANO-IMPRINT LITHOGRAPHIES;
NANOIMPRINT MOLDS;
NOVEL METHODS;
REACTIVE IONS;
T-GATES;
T-SHAPED GATES;
ELECTRON BEAMS;
MOLDS;
REACTIVE ION ETCHING;
NANOIMPRINT LITHOGRAPHY;
NANOMATERIAL;
ARTICLE;
ELECTRON BEAM;
NANOFABRICATION;
NANOTECHNOLOGY;
PRESSURE;
PRIORITY JOURNAL;
SEMICONDUCTOR;
VAPOR;
CHEMISTRY;
CONFORMATION;
CRYSTALLIZATION;
EQUIPMENT;
EQUIPMENT DESIGN;
EVALUATION;
INSTRUMENTATION;
MACROMOLECULE;
MATERIALS TESTING;
METHODOLOGY;
PARTICLE SIZE;
SIGNAL PROCESSING;
SURFACE PROPERTY;
ULTRASTRUCTURE;
CRYSTALLIZATION;
EQUIPMENT DESIGN;
EQUIPMENT FAILURE ANALYSIS;
MACROMOLECULAR SUBSTANCES;
MATERIALS TESTING;
MOLECULAR CONFORMATION;
NANOSTRUCTURES;
NANOTECHNOLOGY;
PARTICLE SIZE;
SIGNAL PROCESSING, COMPUTER-ASSISTED;
SURFACE PROPERTIES;
TRANSISTORS;
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EID: 65549113366
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/20/18/185302 Document Type: Article |
Times cited : (13)
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References (8)
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