MAPLE deposition and characterization of SnO2 colloidal nanoparticle thin films

Journal of Physics D: Applied Physics

Volumn 42, Issue 9, 2009, Pages

  Caricato, A P ^a   Epifani, M ^b   Martino, M ^a   Romano, F ^a   Rella, R ^b   Taurino, A ^b   Tunno, T ^a   Valerini, D ^a  

^a UNIVERSITY OF SALENTO   (Italy)

^b CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AS-DEPOSITED FILMS; CAPPING LAYERS; COLLOIDAL NANOPARTICLES; CONCENTRATION OF; ENERGY GAP VALUES; FOURIER TRANSFORM INFRA-RED SPECTROSCOPIES; FT-IR ANALYSIS; HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPIES; IN VACUUMS; LIQUID NITROGEN TEMPERATURES; MATRIX-ASSISTED PULSED LASER EVAPORATIONS; NANOPARTICLE FILMS; OPTICAL CHARACTERIZATIONS; QUANTUM CONFINEMENT EFFECTS; SEM; SI SUBSTRATES; TRIOCTYLPHOSPHINE;

CHARACTERIZATION; ENERGY GAP; EXCIMER LASERS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GAS LASERS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; KRYPTON; LIQUID NITROGEN; OPTICAL MICROSCOPY; PULSED LASER APPLICATIONS; SCANNING; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICA; SOLIDS; SPECTROSCOPIC ANALYSIS; THIN FILMS; TIN; TITANIUM COMPOUNDS; TOLUENE;

NANOPARTICLES;

EID: 65449187187     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/42/9/095105     Document Type: Article

References (26)

1. Fendler J H 1998 Nanoparticles and Nanostructured Films (Weinheim: Wiley-VCH)
2. Freeman R G et al 1995 Science 267 1629
3. Lu L, Sun G, Zhang H, Wang H, Xi S, Hu J, Tian Z and Chen R 2004 J. Mater. Chem. 14 1005
4. Huang X-J and Choi Y-K 2007 Sensors Actuators B 122 659
5. Heinrichsdorff F, Mao M H, Kirstaedter N, Krost A, Bimberg D, Kosogov A O and Werner P 1997 Appl. Phys. Lett. 71 22
6. Liu W L, Lee P F, Dai J Y, Wang J, Chan H L W, Choy C L, Song Z T and Feng S L 2005 Appl. Phys. Lett. 86 013110
7. Lam H M, Hong M H, Yuan S and Chong T C 2004 Appl. Phys. A 79 2099
8. Amoruso S, Bruzzese R, Spinelli N, Velotta R, Vitiello M, Wang X, Ausanio G, Iannotti V and Lanotte L 2004 Appl. Phys. Lett. 84 4502
9. Epifani M, Arbiol J, Díaz R, Perálvarez M J, Siciliano P and Morante J R 2005 Chem. Mater. 17 6468
10. Pinna N, Neri G, Antonietti M and Niederberger M 2004 Angew. Chem. Int. Edn Engl. 43 4345
11. Crooker S A, Hollingsworth J A, Tretiak S and Klimov V I 2002 Phys. Rev. Lett. 89 186802
12. Chrisey D B, Piquè A, McGill R A, Horwitz J S and Ringeisen B R 2003 Chem. Rev. 103 553
13. Wu P K, Fitz-Gerald J, Pique A, Chrisey D B and McGill R A 2000 Materials Research Society Symp. Proc. 617 (Laser-Solid Interactions for Materials Processing) article J2.3.1
14. Caricato A P, Catalano M, Ciccarella G, Martino M, Rella R, Romano F, Spadavecchia J, Taurino A, Tunno T and Valerini D 2006 Digest J. Nanomater. Biostruct. 1 43
15. Caricato A P, Capone S, Ciccarella G, Martino M, Rella R, Romano F, Spadavecchia J, Taurino A, Tunno T and Valerini D 2007 Appl. Surf. Sci. 253 7937
16. Park S H, Son Y C, Willis W S, Suib S L and Creasy K E 1998 Chem. Mater. 10 2389
17. Rowsell B D and Veinot J G C 2005 Nanotechnology 16 732
18. http://riodb01.ibase.aist.go.jp/sdbs/cgi-bin/cre-index.cgi?lang=eng
19. Gu F, Wang S F, Song C F, Lu M K, Qi Y X, Zhou G J, Xu D and Yuan D R 2003 Chem. Phys. Lett. 372 451
20. Burns G 1985 Solid State Physics (New York: Academic)
21. Suda Y, Kawasaki H, Namba J, Iwatsuji K, Doi K and Wada K 2003 Surf. Coat. Technol. 174-5 1293
22. Lee E J H, Ribeiro C, Giraldi T R, Longo E, Leite E R and Varela J A 2004 Appl. Phys. Lett. 84 1745
23. Das S, Kar S and Chaudhuri S 2006 J. Appl. Phys. 99 114303
24. Brus L E 1984 J. Chem. Phys. 80 4403
25. Izydorcyzk W, Adamowicz B, Miczek M and Waczynski K 2006 Phys. Status Solidi a 203 2241
26. Rantala T S and Lantto V 1996 Surf. Sci. 353 765