Temperature-dependent EXAFS analysis of embedded Pt nanocrystals

Journal of Physics Condensed Matter

Volumn 21, Issue 15, 2009, Pages

  Giulian, R ^a   Araujo, L L ^a   Kluth, P ^a   Sprouster, D J ^a   Schnohr, C S ^a   Foran, G J ^b   Ridgway, M C ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

BULK MATERIALS; CAPILLARY PRESSURES; EINSTEIN TEMPERATURES; EXTENDED X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; FINITE-SIZE EFFECTS; INTER-ATOMIC DISTANCES; MATRIXES; TEMPERATURE DEPENDENTS; TEMPERATURE RANGES; TEMPERATURE-DEPENDENT EXAFS; THERMAL PROPERTIES; VIBRATIONAL FREQUENCIES;

ABSORPTION SPECTROSCOPY; ION BOMBARDMENT; ION IMPLANTATION; NANOCRYSTALS; PLATINUM; SILICON COMPOUNDS; THERMAL STRESS;

THERMAL EXPANSION;

EID: 65449137064     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/21/15/155302     Document Type: Article

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