Bond length contraction in Au nanocrystals formed by ion implantation into thin SiO2

Applied Physics Letters

Volumn 85, Issue 16, 2004, Pages 3561-3563

  Kluth, P ^a   Johannessen, B ^a   Giraud, V ^a   Cheung, A ^a   Glover, C J ^a   De Azevedo, G M ^a,c   Foran, G J ^b   Ridgway, M C ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^c LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ANNEALING; CHEMICAL BONDS; CRYSTALS; GOLD; NANOSTRUCTURED MATERIALS; OPTICAL FIBERS; SILICA; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

BOND LENGTH; LIQUID-DROP MODEL; NANOCRYSTALS; RELAXATION;

ION IMPLANTATION;

EID: 9744225834     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1803619     Document Type: Article

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