Structural characterization of Cu nanocrystals formed in SiO 2 by high-energy ion-beam synthesis

Journal of Applied Physics

Volumn 98, Issue 2, 2005, Pages

  Johannessen, B ^a   Kluth, P ^a   Glover, C J ^a   Azevedo, G De M ^a,c   Llewellyn, D J ^a   Foran, G J ^b   Ridgway, M C ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^b AUSTRALIAN NUCLEAR SCIENCE AND TECHNOLOGY ORGANISATION   (Australia)

^c LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER ATOMS; STRUCTURAL DISORDER; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

AMORPHOUS MATERIALS; BACKSCATTERING; ELECTRON MICROSCOPY; ION BEAMS; ION IMPLANTATION; NANOSTRUCTURED MATERIALS; OXIDATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICA; SPECTROSCOPY; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

COPPER;

EID: 23844544718     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1980533     Document Type: Review

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