-
1
-
-
34547926126
-
Effects of adsorbed water layer structure on adhesion force of silicon oxide nanoasperity contact in humid ambient
-
Asay D B and Kim S H 2006 Effects of adsorbed water layer structure on adhesion force of silicon oxide nanoasperity contact in humid ambient J. Chem. Phys. 124 174712-5
-
(2006)
J. Chem. Phys.
, vol.124
, Issue.17
, pp. 174712-174715
-
-
Asay, D.B.1
And Kim, S.H.2
-
2
-
-
0036354543
-
Pull-off force measurements between rough surfaces by atomic force microscopy
-
Beach E R, Tormoen G W, Drelich J and Han R 2002 Pull-off force measurements between rough surfaces by atomic force microscopy J. Colloid Interface Sci. 247 84-99
-
(2002)
J. Colloid Interface Sci.
, vol.247
, Issue.1
, pp. 84-99
-
-
Beach, E.R.1
Tormoen, G.W.2
Drelich, J.3
Han, R.4
-
3
-
-
0942289266
-
Adhesion and stiction: Mechanisms, measurement techniques, and methods for reduction
-
Bhushan B 2003 Adhesion and stiction: mechanisms, measurement techniques, and methods for reduction J. Vac. Sci. Technol. B 21 2262-96
-
(2003)
J. Vac. Sci. Technol.
, vol.21
, Issue.6
, pp. 2262-2296
-
-
Bhushan, B.1
-
4
-
-
34547850195
-
Shear stress measurements on InAs nanowires by AFM manipulation
-
DOI 10.1002/smll.200700052
-
Bordag M, Ribayrol A, Conache G, Froberg L E, Gray S, Samuelson L, Montelius L and Pettersson H 2007 Shear stress measurements on inas nanowires by AFM manipulation Small 3 1398-401 (Pubitemid 47245535)
-
(2007)
Small
, vol.3
, Issue.8
, pp. 1398-1401
-
-
Bordag, M.1
Ribayrol, A.2
Conache, G.3
Froberg, L.E.4
Gray, S.5
Samuelson, L.6
Montelius, L.7
Pettersson, H.8
-
5
-
-
0023817433
-
STATIC FRICTION COEFFICIENT MODEL for METALLIC ROUGH SURFACES.
-
Chang W R, Etsion I and Bogy D B 1988 Static friction coefficient model for metallic rough surfaces J. Tribol. 110 57-63 (Pubitemid 18567929)
-
(1988)
Journal of Tribology
, vol.110
, Issue.1
, pp. 57-63
-
-
Chang, W.R.1
Etsion, I.2
Bogy, D.B.3
-
6
-
-
2142713126
-
Effect of adhesion on dynamic and static friction in surface micromachining
-
Corwin A D and De Boer M P 2004 Effect of adhesion on dynamic and static friction in surface micromachining Appl. Phys. Lett. 84 2451
-
(2004)
Appl. Phys. Lett.
, vol.84
, Issue.13
, pp. 2451
-
-
Corwin, A.D.1
And De Boer, M.P.2
-
7
-
-
33846437789
-
Sliding of zinc oxide nanowires on silicon substrate
-
Desai A V and Haque M A 2007 Sliding of zinc oxide nanowires on silicon substrate Appl. Phys. Lett. 90 033102
-
(2007)
Appl. Phys. Lett.
, vol.90
, Issue.3
, pp. 033102
-
-
Desai, A.V.1
And Haque, M.A.2
-
8
-
-
0034562028
-
Mechanics and friction at the nanometer scale
-
DOI 10.1023/A:1010017130136
-
Falvo M and Superfine R 2000 Mechanics and friction at the nanometer scale J. Nanopart. Res. 2 237-48 (Pubitemid 33229994)
-
(2000)
Journal of Nanoparticle Research
, vol.2
, Issue.3
, pp. 237-248
-
-
Falvo, M.R.1
Superfine, R.2
-
9
-
-
22644436062
-
Accounting for the JKR-DMT transition in adhesion and friction measurements with atomic force microscopy
-
Grierson D S, Flater E E and Carpick R W 2005 Accounting for the JKR-DMT transition in adhesion and friction measurements with atomic force microscopy J. Adhes. Sci. Technol. 19 291-311
-
(2005)
J. Adhes. Sci. Technol.
, vol.19
, Issue.3
, pp. 291-311
-
-
Grierson, D.S.1
Flater, E.E.2
Carpick, R.W.3
-
10
-
-
0036544276
-
Application of MEMS force sensors for in situ mechanical characterization of nano-scale thin films in SEM and TEM
-
DOI 10.1016/S0924-4247(01)00861-5, PII S0924424701008615
-
Haque M A and Saif M T A 2002 Application of MEMS force sensors for in-situ mechanical characterization of nano-scale thin films in SEM & TEM Sensors Actuators A 97-98 239-45 (Pubitemid 34758732)
-
(2002)
Sensors and Actuators, A: Physical
, vol.97-98
, pp. 239-245
-
-
Haque, M.A.1
Saif, M.T.A.2
-
11
-
-
0005681276
-
Adsorbed layers and the origin of static friction
-
DOI 10.1126/science.284.5420.1650
-
He G, Muser M H and Robbins M O 1999 Adsorbed layers and the origin of static friction Science 284 1650-3 (Pubitemid 29291370)
-
(1999)
Science
, vol.284
, Issue.5420
, pp. 1650-1652
-
-
Gang, H.1
Muser, M.H.2
Robbins, M.O.3
-
12
-
-
42549115307
-
Massive assembly of ZnO nanowire-based integrated devices
-
Kang J, Myung S, Kim B, Oh D, Kim G T and Hong S 2008 Massive assembly of ZnO nanowire-based integrated devices Nanotechnology 19 095303
-
(2008)
Nanotechnology
, vol.19
, Issue.9
, pp. 095303
-
-
Kang, J.1
Myung, S.2
Kim, B.3
Oh, D.4
Kim, G.T.5
Hong, S.6
-
13
-
-
33748593098
-
Nanowire electronic and optoelectronic devices
-
DOI 10.1016/S1369-7021(06)71650-9, PII S1369702106716509
-
Li Y, Qian F, Xiang J and Lieber C M 2006 Nanowire electronic and optoelectronic devices Mater. Today 9 18-27 (Pubitemid 44380401)
-
(2006)
Materials Today
, vol.9
, Issue.10
, pp. 18-27
-
-
Li, Y.1
Qian, F.2
Xiang, J.3
Lieber, C.M.4
-
15
-
-
43949114211
-
Synthesis and elastic characterization of zinc oxide nanowires
-
Manoharan M P, Desai A V, Neely G and Haque M A 2008 Synthesis and elastic characterization of zinc oxide nanowires J. Nanomater. 2008 849745
-
(2008)
J. Nanomater.
, vol.2008
, pp. 849745
-
-
Manoharan, M.P.1
Desai, A.V.2
Neely, G.3
Haque, M.A.4
-
16
-
-
33745049187
-
Dielectrophoretic assembly of reversible and irreversible metal nanowire networks and vertically aligned arrays
-
DOI 10.1063/1.2209174
-
Papadakis S J, Gu Z and Gracias D H 2006 Dielectrophoretic assembly of reversible and irreversible metal nanowire networks and vertically aligned arrays Appl. Phys. Lett. 88 233118 (Pubitemid 43877770)
-
(2006)
Applied Physics Letters
, vol.88
, Issue.23
, pp. 233118
-
-
Papadakis, S.J.1
Gu, Z.2
Gracias, D.H.3
-
17
-
-
0037257496
-
Static friction in elastic adhesion contacts in MEMS
-
Tas N R, Gui C and Elwenspoek M 2003 Static friction in elastic adhesion contacts in MEMS J. Adhes. Sci. Technol. 17 547-61
-
(2003)
J. Adhes. Sci. Technol.
, vol.17
, Issue.4
, pp. 547-561
-
-
Tas, N.R.1
Gui, C.2
Elwenspoek, M.3
-
18
-
-
36449000563
-
Comparison of surface roughness of polished silicon wafers measured by light scattering topography, soft-x-ray scattering, and atomic-force microscopy
-
Teichert C, MacKay J F, Savage D E, Lagally M G, Brohl M and Wagner P 1995 Comparison of surface roughness of polished silicon wafers measured by light scattering topography, soft-x-ray scattering, and atomic-force microscopy Appl. Phys. Lett. 66 2346-8
-
(1995)
Appl. Phys. Lett.
, vol.66
, Issue.18
, pp. 2346-2348
-
-
Teichert, C.1
MacKay, J.F.2
Savage, D.E.3
Lagally, M.G.4
Brohl, M.5
Wagner, P.6
-
19
-
-
34547274267
-
Microdevice for measuring friction and adhesion properties of sidewall contact interfaces of microelectromechanical systems
-
DOI 10.1063/1.2742648
-
Timpe S J and Komvopoulos K 2007 Microdevice for measuring friction and adhesion properties of sidewall contact interfaces of microelectromechanical systems Rev. Sci. Instrum. 78 065106 (Pubitemid 47141549)
-
(2007)
Review of Scientific Instruments
, vol.78
, Issue.6
, pp. 065106
-
-
Timpe, S.J.1
Komvopoulos, K.2
-
20
-
-
39449095981
-
Effects of contact geometry on pull-off force measurements with a colloidal probe
-
Yang S, Zhang H, Nosonovsky M and Chung K-H 2008 Effects of contact geometry on pull-off force measurements with a colloidal probe Langmuir 24 743-8
-
(2008)
Langmuir
, vol.24
, Issue.3
, pp. 743-748
-
-
Yang, S.1
Zhang, H.2
Nosonovsky, M.3
Chung, K.-H.4
-
21
-
-
2042493009
-
Fundamental mechanisms of interfacial friction: 1. Relation between adhesion and friction
-
Yoshizawa H, Chen Y-L and Israelachvili J N 1993 Fundamental mechanisms of interfacial friction: 1. Relation between adhesion and friction J. Phys. Chem. 97 4128-40
-
(1993)
J. Phys. Chem.
, vol.97
, Issue.16
, pp. 4128-4140
-
-
Yoshizawa, H.1
Chen, Y.-L.2
Israelachvili, J.N.3
|