Effects of contact geometry on pull-off force measurements with a colloidal probe

Langmuir

Volumn 24, Issue 3, 2008, Pages 743-748

  Yang, Seungho ^a   Zhang, Huan ^a,b   Nosonovsky, Michael ^a   Chung, Koo Hyun ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Bldg 142   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPILLARY FORCE; CONTACT GEOMETRY; DIRECT SCANNING METHOD; MAGNITUDE ANALYSIS; TILT ANGLES;

ADHESION; ATMOSPHERIC HUMIDITY; ATOMIC FORCE MICROSCOPY; COLLOIDS; SEPARATION; SILICON WAFERS; SURFACE ROUGHNESS;

COMPUTATIONAL GEOMETRY;

EID: 39449095981     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la701900f     Document Type: Article

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