X-ray photoelectron spectroscopy and the auger parameter as tools for characterization of silica-supported pd catalysts for the suzuki-miyaura reaction

Journal of Physical Chemistry C

Volumn 113, Issue 5, 2009, Pages 1901-1907

  McEleney, Kevin ^a   Crudden, Cathleen M ^a   Horton, J Hugh ^a  

^a QUEEN S UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICATES; AUGER PARAMETERS; AUGER SPECTROSCOPIES; BEFORE AND AFTER; ELECTRONIC ENVIRONMENTS; HETEROGENEOUS CATALYSTS; MESOPOROUS; OXIDATION STATE; POLARIZABILITY; S LIGANDS; SOLID SAMPLES; STATE CHARACTERIZATIONS; SUPPORTED PD CATALYSTS; SUZUKI-MIYAURA; SUZUKI-MIYAURA REACTIONS; X-RAY PHOTOELECTRON SPECTROSCOPIES; XPS;

AUGERS; BINDING ENERGY; CATALYSIS; CATALYSTS; ELECTRON SPECTROSCOPY; LIGANDS; OXIDATION; PALLADIUM; PARAMETER ESTIMATION; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; POLYMER BLENDS; SILICA; SILICATES; SPECTRUM ANALYSIS;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 65349182461     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp808837k     Document Type: Article

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