Three-dimensional elemental imaging using a confocal X-ray fluorescence microscope

American Laboratory

Volumn 38, Issue 8, 2006, Pages 15-22

  Patterson, Brian M ^a   Havrilla, George J ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; ELECTRIC EXCITATION; FLUORESCENCE; PHOTONS; X RAY MICROSCOPES;

ELEMENTAL ANALYSIS; EXCITATION SOURCE; MATERIALS CHARACTERIZATION; MICRO X-RAY FLUORESCENCE (MXRF) MICROSCOPE;

IMAGING TECHNIQUES;

EID: 33744986540     PISSN: 00447749     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Review

References (5)

1. Havrilla, G.J.; Miller, T. Micro X-ray fluorescence in materials characterization. Powder Diffr. 2004, 19(2), 119-26.
2. Miller, T; Havrilla, G.J. Elemental imaging for pharmaceutical tablet formulation analysis by micro X-ray fluorescence. Powder Diffr. 2005, 20(2), 153-7.
3. Ding, X.; Gao, N.; Havrilla, G. Monolithic polycapillary X-ray optics engineered to meet a wide range of applications. Proceedings of SPIE-The International Society for Optical Engineering, 2000, 4144, 174-82.
4. Kanngiesser, B; Malzer, W; Reiche, I. A new 3D micro X-ray fluorescence analysis set-up. First archaeometric applications. Nucl. Instrum. Meth. Phys. Res., Sect. B (Beam Interactions with Materials and Atoms) 2003, 211(2), 259-64.
5. Vekemans, B.; Vincze, L.; Brenker, F.E.; Adams, F. Processing of three-dimensional microscopic X-ray fluorescence data. J. Anal. At. Spectrom. 2004, 19(10), 1302-8.