Effect of surfactant treatment on the magnetic properties of Mn-doped ZnO bulk and nanoparticles

Journal of Physical Chemistry C

Volumn 113, Issue 12, 2009, Pages 4814-4819

  Jayakumar, O D ^a,b,c   Sudakar, C ^a,b,c   Vinu, A ^a,b,c   Asthana, A ^a,b,c   Tyagi, A K ^a,b,c  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

^b WAYNE STATE UNIVERSITY   (United States)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CO-DOPED ZNO; DC MAGNETIZATIONS; LOW-TEMPERATURE REACTIONS; MN-DOPED ZNO; NANO-METER REGIMES; OXIDATION STATE; ROOM TEMPERATURE FERROMAGNETISMS; SPHERICAL PARTICLES; STRUCTURAL AND MAGNETIC PROPERTIES; SULFOSUCCINATE; SURFACTANT TREATMENTS; TEM; TRANSMISSION ELECTRONS; WURTZITE; X- RAY DIFFRACTIONS; XPS DATUM; ZNO STRUCTURES;

CRYSTAL IMPURITIES; CRYSTAL STRUCTURE; FERROMAGNETISM; MAGNETIC PROPERTIES; MANGANESE COMPOUNDS; NANOPARTICLES; SEMICONDUCTING ZINC COMPOUNDS; SURFACE ACTIVE AGENTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS; ZINC; ZINC OXIDE; ZINC SULFIDE;

MANGANESE;

EID: 65249188721     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp809288s     Document Type: Article

References (41)

1. Ohno, H. Science 1998, 281, 951.
2. Bryan, J. D.; Heald, S. M.; Chambers, S. A.; Gamelin, D. R. J. Am. Chem. Soc. 2004, 126, 11640.
3. Janisch, R.; Gopal, P.; Spaldin, N. A. J. Phys: Condens. Matter 2005, 17, R657.
4. Dietl, T.; Ohno, H.; Matsukura, F.; Cibert, J.; Ferrand, D. Science 2000, 287, 1019.
5. Fukumura, T.; Jin, Z.; Kawasaki, M.; Shono, T.; Hasegawa, T.; Koshihara, S.; Kionuma, H. Appl. Phys. Lett. 2001, 78, 958.
6. Jung, S. W.; An, S.-J.; Yi, G.-C.; Jung, C. U.; Lee, S.-I.; Cho, S. Appl. Phys. Lett. 2002, 80, 4561.
7. Tiwari, A.; Jin, C.; Kvit, A.; Kumar, D.; Muth, J.; Narayan, J. Solid State Commun. 2002, 121, 371.
8. Sharma, P.; Gupta, A.; Rao, K. V.; Owens, F. J.; Sharma, R.; Ahuja, R.; Guillen, J. M. O.; Johansson, B.; Gehring, G. A. Nat. Mater. 2003, 2, 673.
9. Kundaliya, D. C.; Ogale, S. B.; Loflano, S. E.; Dhar, S.; Metting, C. J.; Shinde, S. R.; Ma, Z.; Varughese, B.; Ramanujachary, K. V.; Salamanca-riba, L.; Venkatesan, T. Nat. Mater. 2004, 3, 709.
10. Garcia, M. A.; Ruiz-Gonzalez, M. L.; Quesada, A.; Costa-Kraemer, J. L.; Fernandez, J. F.; Khatib, S. J.; Wennberg, A.; Caballero, A. C.; Martin- Gonzalez, M. S.; Villegas, M.; Friones, F.; Gonzalez-Calbet, J. M.; Hernando, A. Phys. Rev. Lett. 2005, 94, t217206.
11. Norton, D. P.; Pearton, S. J.; Hebard, A. F.; Theodoropoulou, N. A.; Boatner, L. A.; Wilson, R. G. Appl. Phys. Lett. 2003, 82, 239.
12. Ohno, Y.; Young, D. K.; Beshoten, B.; Matsukura, F.; Ohno, H.; Awschalom, D. I. Nature 1999, 402, 790.
13. Pearton, S. J.; Abernathy, C. R.; Overberg, M. E.; Thaler, G. T.; Nortan, D. P.; Theodoropoulou, N. A.; Hebard, A. F.; Park, Y. D.; Ren, F.; Kim, J.; Boatner, L. A. J. Apply. Phys. 2003, 93, 1.
14. Kittilstved, K. R.; Norberg, N. S.; Gamelin, D. R. Phys. Rev. Lett. 2005, 94, 147209.
15. Zhang, X. L.; Qiao, R.; Kim, J. C.; Kang, Y. S. Cryst. Growth Des. 2008, 8, 2609.
16. Jayakumar, O. D.; Gopalakrishnan, I. K.; Sudakar, C.; Kulshreshtha, S. K. J. Cryst. Growth 2006, 294, 432.
17. Jayakumar, O. D.; Gopalakrishnan, I. K.; Sudakar, C.; Kulshreshtha, S. K. J. Alloys Compds. 2007, 438, 258.
18. Coey, J. M. D.; Venkatesan, M.; Fitzgerald, C. B. Nat. Mater. 2005, 4, 173.
19. Xu, X. H.; Blythe, H. J.; Ziese, M.; Behan, A. J.; Neal, J. R.; Mokhtari, A.; Ibrahim, R. M.; Fox, A. M.; Gehring, G. M. New J. Phys. 2006, 8, 135.
20. Coey, J. M. D.; Douvalis, A. P.; Fitzgerald, C. B.; Venkatesan, M. Appl. Phys. Lett. 2004, 84, 1332.
21. Kittilstved, K. R.; Schwartz, D. A.; Tuan, A. C.; Heald, S. M.; Chambers, S. A.; Gamelin, D. R. Phys. Rev. Lett. 2006, 97, 037203.
22. Liu, W. K.; Whitaker, K. M.; Kittilstved, K. R.; Gamelin, D. R. J. Am. Chem. Soc. 2006, 128, 3910.
23. Meron, T.; Markovich, G. J. Phys. Chem. 2005, B 109, 20232.
24. Sudakar, C.; Kharel, P.; Lawes, G.; Suryanarayanan, R.; Naik, R.; Naik, V. M. Apply. Phys. Lett. 2008, 92, 062501.
25. Wang, Z.; Zhang, H.; Zhang, L.; Yuan, J.; Yan, S.; Wang, C. Nanotechnology 2003, 14, 11.
26. Rodriguez-Carvajal, Fullprof: a program for Rietveld Refinement and Profile Matching analysis of Complex Powder Diffraction Patterns ILL. XV Congress of the IUCr, 1990 International Union of Crystallography: Toulouse, France, p 127.
27. Joseph, M.; Tabata, H.; Kawai, T. Appl. Phys. Lett. 1999, 74, 2534.
28. Yang, L. W.; Wu, X. L.; Huang, G. S.; Qiu, T.; Yang, Y. M. J. Appl. Phys. 2005, 97, 014308.
29. Kunisu, M.; Oba, F.; Ikeno, H.; Tanaka, I.; Yamamoto, T. Appl. Phys. Lett. 2005, 86, 121902.
30. Jayakumar, O. D.; Gopalakrishnan, I. K.; Kulshrestha, S. K. Physica B 2006, 381, 194.
31. Jayakumar, O. D.; Sudakar, C.; Gopalakrishnan, I. K. J. Cryst. Growth 2008, 310, 3251.
32. Copel, M.; Reuter, M. C.; Kaxiras, E.; Tomp, R. M. Phys. Rev. Lett. 1989, 63, 632.
33. Zhu, W.; Weitering, H. H.; Wang, E. G.; Kaxiras, E.; Zhang, Phys. Rev. Lett. 2004, 93, 126102.
34. Sundaresan, A.; Bhargavi, R.; Rangarajan, N.; Siddesh, U.; Rao, C. N. R. Phys. Rev. 2006, B 74, 161306.
35. Zhou, S.; Xu, Q.; Potzger, K.; Talut, G.; Grötzschel, R.; Fassbender, J.; Vinnichenko, M.; Grenzer, J.; Helm, M.; Hochmuth, H.; Lorenz, M.; Grundmann, M.; Schmidt, H. Apply. Phys. Lett. 2008, 93, 232507.
36. Schwartz, D. A.; Norberg, N. S.; Nguyen, Q. P.; Parker, J. M.; Gamelin, D. R. J. Am. Chem. Soc. 2003, 125, 13205.
37. Schwartz, D. A.; Gamelin, D. R. Adv. Mater. 2004, 16, 2115.
38. Bergqvist, L.; Eriksson, O.; Kudenovsky, J.; Drchal, V.; Korzhavyi, P.; Turek, L. Phys. Rev. Lett. 2004, 93, 137202.
39. Baik, J. M.; Lee, J. L. Adv. Mater. 2005, 17, 2745.
40. Ramachandran, S.; Narayan, J.; Prater, J. T. Appl. Phys. Lett. 2006, 88, 242503.
41. Wang, J. B.; Huang, G. J.; Zhong, X. L.; Sun, L. Z.; Zhou, Y. C.; Liu, E. H. Appl. Phys. Lett. 2006, 88, 252502.