Direct comparison of total reflection techniques by using a plate beamguide

X-Ray Spectrometry

Volumn 31, Issue 2, 2002, Pages 145-149

  Sánchez, Héctor J ^a  

^a UNIVERSIDAD NACIONAL DE CÓRDOBA   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION;

DETECTION LIMITS; EMISSION METHOD; EXPERIMENTAL CHARACTERIZATION; GRAZING INCIDENCE; METHODS OF MEASUREMENT; SIMPLE++; SOURCE DETECTORS; SPECTRA'S; TOTAL REFLECTION; TOTAL REFLECTION X-RAY FLUORESCENCE ANALYSIS;

FLUORESCENCE;

EID: 0036114570     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.545     Document Type: Article

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