An enhanced contrast to detect bulk objects under arbitrary rough surfaces

Optics Express

Volumn 17, Issue 7, 2009, Pages 5758-5773

  Arnaud, L ^a   Georges, G ^a   Sorrentini, J ^a   Zerrad, M ^a   Deumie C ^a   Amra, C ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT SCATTERING; MICROSTRUCTURE; OBJECT DETECTION; SURFACE MEASUREMENT;

ANALYTICAL DETERMINATION; ELIMINATION PROCEDURE; ENHANCED CONTRAST; RAPID VARIATION; ROUGH SURFACES; SCATTERING ANGLES; SCATTERING LEVELS; SELECTIVE REDUCTION;

SURFACE SCATTERING;

ALGORITHM; ARTICLE; AUTOMATED PATTERN RECOGNITION; COMPUTER ASSISTED DIAGNOSIS; IMAGE ENHANCEMENT; MATERIALS; MATERIALS TESTING; METHODOLOGY; PHOTOMETRY; REFRACTOMETRY; SURFACE PROPERTY;

ALGORITHMS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MANUFACTURED MATERIALS; MATERIALS TESTING; PATTERN RECOGNITION, AUTOMATED; PHOTOMETRY; REFRACTOMETRY; SURFACE PROPERTIES;

EID: 65249109803     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.005758     Document Type: Article

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