Discrimination of surface and bulk scattering of arbitrary level based on angle-resolved ellipsometry: Theoretical analysis

Optics Communications

Volumn 281, Issue 6, 2008, Pages 1739-1744

  Arnaud, Laurent ^a   Georges, Gaëlle ^a   Deumié, Carole ^a   Amra, Claude ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

Light scattering; Optical characterization; Rigorous scattering model; Rough surfaces

Indexed keywords

CHARACTERIZATION; ELLIPSOMETRY; MATHEMATICAL MODELS; POLARIZATION; SURFACES;

OPTICAL CHARACTERIZATION; RANDOM MEDIA; RIGOROUS SCATTERING MODELS; ROUGH SURFACES;

LIGHT SCATTERING;

EID: 38549091567     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2007.11.013     Document Type: Article

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