Partial polarization of light induced by random defects at surfaces or bulks

Optics Express

Volumn 16, Issue 14, 2008, Pages 10342-10354

  Amra, Claude ^a   Zerrad, Myriam ^a   Siozade, Laure ^a   Georges, Gaelle ^a   Deumié, Carole ^a  

^a AIX MARSEILLE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHM; ARTICLE; ELECTROMAGNETIC FIELD; INSTRUMENTATION; LIGHT; METHODOLOGY; OPTICS; POLARIZATION MICROSCOPY; RADIATION SCATTERING; REFRACTOMETRY; STATISTICAL MODEL; SURFACE PROPERTY;

ALGORITHMS; ELECTROMAGNETIC FIELDS; LIGHT; MICROSCOPY, POLARIZATION; MODELS, STATISTICAL; OPTICS; REFRACTOMETRY; SCATTERING, RADIATION; SURFACE PROPERTIES;

LIGHT POLARIZATION; SPECKLE; SURFACE ROUGHNESS;

BULK HETEROGENEITY; INCIDENT BEAMS; PARTIAL POLARIZATION; POLARIZATION MEASUREMENTS; RANDOM DEFECTS; ROUGH SURFACES; SCATTERING PROCESS; SPECKLE PATTERNS;

POLARIZATION;

EID: 47249089602     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.010372     Document Type: Article

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