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Volumn 113, Issue 15, 2009, Pages 5902-5905

Morphology instability of silicon nitride nanowires

Author keywords

[No Author keywords available]

Indexed keywords

1D NANOSTRUCTURES; HIGH-TEMPERATURE ANNEALING; HIGH-TEMPERATURE APPLICATIONS; LIMITING FACTORS; SILICON-NITRIDE NANOWIRES; SURFACE ENERGIES; WIDTH-TO-THICKNESS RATIOS;

EID: 65249100810     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp901938a     Document Type: Article
Times cited : (14)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.